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d8 discover hybrid  (Bruker Corporation)


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    Bruker Corporation d8 discover hybrid
    D8 Discover Hybrid, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 26583 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/d8+discover+hybrid/D8+DISCOVER/us11929416-1590-7-12
    Average 99 stars, based on 26583 article reviews
    d8 discover hybrid - by Bioz Stars, 2026-09
    99/100 stars

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    Article Title: Oxide semiconductor film, semiconductor device including the oxide semiconductor film, and display device including the semiconductor device
    Article Snippet: The XRD analysis was performed on Samples E1 to E9 using a multifunction thin film material evaluation X-ray diffractometer, D8 DISCOVER Hybrid, manufactured by Bruker AXS.

    Article Title: Oxide semiconductor film and semiconductor device
    Article Snippet: For the XRD evaluation, a multifunction thin film material evaluation X-ray diffractometer, D8 DISCOVER Hybrid, manufactured by Bruker AXS was used.

    Article Title: Semiconductor device and method for manufacturing semiconductor device
    Article Snippet: In this example, as an XRD apparatus, D8 DISCOVER Hybrid manufactured by Bruker Corporation was used.

    Article Title: Oxide semiconductor film and semiconductor device
    Article Snippet: For the XRD evaluation, a multifunction thin film material evaluation X-ray diffractometer, D8 DISCOVER Hybrid, manufactured by Bruker AXS was used.

    Article Title: Oxide semiconductor film, semiconductor device including the oxide semiconductor film, and display device including the semiconductor device
    Article Snippet: <> The XRD analysis was performed using a multifunction thin film material evaluation X-ray diffractometer, D8 DISCOVER Hybrid, manufactured by Bruker AXS.

    Article Title: Oxide semiconductor film, semiconductor device including the oxide semiconductor film, and display device including the semiconductor device
    Article Snippet: The XRD analysis was performed on Samples A1, A2, and A3 using a multifunction thin film material evaluation X-ray diffractometer, D8 DISCOVER Hybrid, manufactured by Bruker AXS.



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    Image Search Results


    Fig. 4. SEM images of (a) C-dot (b) MXene (c) & (d) MXene/C-dot nanoparticle.

    Journal: Journal of Cleaner Production

    Article Title: Thermo-optical characterization of novel MXene/Carbon-dot hybrid nanofluid for heat transfer applications

    doi: 10.1016/j.jclepro.2023.140395

    Figure Lengend Snippet: Fig. 4. SEM images of (a) C-dot (b) MXene (c) & (d) MXene/C-dot nanoparticle.

    Article Snippet: Phase structure analysis of MXene, C-dot, and hybrid MXene/Cdot nanoparticles was performed using Bruker D8-Discover X-Ray diffractometer with Cu Kα radiation source (λ= 1.54 Å) in the 2 θ angle range of 0–90○ at a scanning rate of 2◦/min.

    Techniques:

    Fig. 5. (a) SEM image of C-dot, EDX mapping of (b) C, (c) N, and (d) O in C-dot, and (e) elemental analysis report of C-dot nanoparticle from SEM-EDX analysis.

    Journal: Journal of Cleaner Production

    Article Title: Thermo-optical characterization of novel MXene/Carbon-dot hybrid nanofluid for heat transfer applications

    doi: 10.1016/j.jclepro.2023.140395

    Figure Lengend Snippet: Fig. 5. (a) SEM image of C-dot, EDX mapping of (b) C, (c) N, and (d) O in C-dot, and (e) elemental analysis report of C-dot nanoparticle from SEM-EDX analysis.

    Article Snippet: Phase structure analysis of MXene, C-dot, and hybrid MXene/Cdot nanoparticles was performed using Bruker D8-Discover X-Ray diffractometer with Cu Kα radiation source (λ= 1.54 Å) in the 2 θ angle range of 0–90○ at a scanning rate of 2◦/min.

    Techniques:

    Fig. 13. Temperature-dependent variation of thermal conductivity of (a) C-dot, (c) MXene, and (e) MXene/Cdot nanofluids and base fluid; and thermal conductivity enhancement of (b) C-dot, (d) MXene, and (f) MXene/Cdot nanofluids over base fluid.

    Journal: Journal of Cleaner Production

    Article Title: Thermo-optical characterization of novel MXene/Carbon-dot hybrid nanofluid for heat transfer applications

    doi: 10.1016/j.jclepro.2023.140395

    Figure Lengend Snippet: Fig. 13. Temperature-dependent variation of thermal conductivity of (a) C-dot, (c) MXene, and (e) MXene/Cdot nanofluids and base fluid; and thermal conductivity enhancement of (b) C-dot, (d) MXene, and (f) MXene/Cdot nanofluids over base fluid.

    Article Snippet: Phase structure analysis of MXene, C-dot, and hybrid MXene/Cdot nanoparticles was performed using Bruker D8-Discover X-Ray diffractometer with Cu Kα radiation source (λ= 1.54 Å) in the 2 θ angle range of 0–90○ at a scanning rate of 2◦/min.

    Techniques: